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Part No.: IS200IGEHG1A
Manufacturer: General Electric
Country of Manufacture: United States of America (USA)
Temperature Operating: -30 to 65 o C
Product Type: IGBT Passive Interface Board
Availability: In Stock
Series: EX2100
IS200IGEHG1A is a IGBT Passive Interface Board developed by GE. It is a part of EX2100 excitation system. It is an integral component designed for use in GE Innovation Series Drives. Its primary function is to serve as a passive interface with the IGBT (Insulated Gate Bipolar Transistor) gate terminals within the drives. It is specifically built for Innovation Series Drives, offering versatility in applications by supporting both simplex and triple redundant configurations based on the unique requirements of the drive system. The board serves as an IGBT Passive Interface Board specifically tailored for the GE Innovation Series Drives. It collaborates with dual modules, providing the necessary components for the passive output stage interface at the gate terminals. This interface board plays a crucial role in normalizing functions relative to the Phase Interface and Control Board.
The WOC team is always available to help you with your EX2100 requirements. For more information, please contact WOC.
What is IS200IGEHG1A?
It is a IGBT Passive Interface Board developed by GE under the EX2100 series.
What type of connectors does the board utilize?
The board is equipped with J1 and J2 plug connectors, which play a crucial role in ensuring secure connections within the system. These connectors facilitate seamless integration and reliable performance.
Can the board be used in both simplex and triple redundant configurations?
Yes, the board is versatile and can be utilized in both simplex and triple redundant applications, depending on the specific needs of the drive system in which it is installed.
Does the it feature any test points for user access?
It has four test points (TP), it's important to note that these are intended for factory use only and are not intended for user access. They are utilized during manufacturing and testing processes.